The loss characteristics of IGBT are closely related to temperature, so the loss values at room temperature of 25 ℃ and high temperature of 125 ℃ are calibrated as the basis. Based on the parameters of 25 ℃ and 125 ℃, the loss data in the full temperature range is obtained through linearization processing.

High and low temperature conditions and dwell time Currently, the new specifications require that the surface temperature of the test object be based on, rather than the air temperature in the test area of the test equipment

An irreversible trend in the semiconductor industry is the continuous increase in chip complexity, which puts forward higher requirements for chip testing.

ThermoTST Temperature Forcing Systems works with the latch test system to conduct static test. The enhanced data set function provides flexibility to meet the test requirements of today's system-level chip design.

Commercial, Industrial and Automotive are the industry's simple division of the chip industry, and their requirements for reliability are also completely different.

The heat shield is a very important part in the cold and hot impact machine system. It is usually used to prevent ambient air from entering and create a closed, repeatable and heat transfer environment.

Under the wave of chip localization, the shipment volume and replacement rate of domestic chips have soared rapidly in recent years.

With the rapid development of automotive semiconductors, we have to mention some challenges brought by the development of semiconductors, especially the challenges of the testing industry.