Reliability is a measure of product durability.

DFT technology is simply to add DFT logic to the chip design, and then after the chip manufacturing is completed, test the chip through the added DFT logic in advance to select the chip with no problems.

WAT test structure usually includes all active and passive components of the process platform

After the chip is packaged, there may be potential defects, which may lead to unstable chip performance or potential defects in function.

SOC design process, including the whole process of digital circuit design front-end and back-end.

Chip testing is an important link to ensure product yield and cost control.

This year's midterm report shows that the performance of domestic semiconductor equipment listed companies has accelerated, the orders of domestic semiconductor equipment listed companies have generally increased at a high rate, and the contractual liabilities have increased significantly.

Reliability of components refers to the ability of products to complete specified functions within specified time and under specified conditions