In the field of electronic product reliability testing, HAST (Highly Accelerated Stress Test) and PCT (Pressure Cooker Test) are two commonly used high-temperature and high humidity accelerated aging testing methods.

What are the differences between THB (Double 85), BHAST, and UHAST? HAST and THB can be selectively validated; If THB or HAST is done, UHAST can be omitted.

Chiller ZC209 is a device that controls the temperature of circulating fluid and outputs cold and hot fluids.

In order to investigate the compatibility and reliability of copper (Cu) interconnects with glass substrates with different chemical properties, we prepared copper test structures on different glass substrates and conducted biased high acceleration stress testing (HAST).

The working principle of the wafer probe station is to achieve the transmission and measurement of electrical signals by contacting a set of micro probes with the testing points of the chip. These probes are usually made of metal materials and can be positioned with micrometer level accuracy.

The temperature chuck TC series developed by Zonglen is an air-cooled high and low temperature chuck system with a temperature range of -65 ℃ to 200 ℃, mainly composed of air-cooled high and low temperature chucks and air-cooled temperature controllers.

Probe station is a wafer probe testing equipment, which plays an important role in the semiconductor device manufacturing process. Through probe testing, abnormal grains in the wafer can be detected in a timely manner, reducing the processing cost of subsequent processes.

Environmental Stress Screening (ESS) test is a testing method that simulates the use of products under extreme environmental conditions to detect potential defects in product design and manufacturing processes.