CP testing (Circuit probing Test) is a key link in the semiconductor manufacturing process, mainly conducting electrical performance testing on chips at the wafer stage.

Conducting HAST (Highly Accelerated Stress Test) testing during chip development is a crucial step in ensuring the long-term reliability of chips in harsh environments.

Domestic heat flow meters have demonstrated unique advantages in intelligence, automation, and system integration, which can significantly improve testing efficiency and data accuracy.

Chiller is a key temperature control system in integrated circuit manufacturing, mainly used in processes such as photolithography, dry etching, chemical vapor deposition (CVD), chemical mechanical polishing (CMP), and rapid thermal processing (RTP)

Chiller ZC209 is a device that controls the temperature of circulating fluid and outputs cold and hot fluids. It has rich functions such as high temperature stability, wide temperature range, fault self diagnosis, and external communication.

Chiller ZC209 is a device that controls the temperature of circulating fluid and outputs cold and hot fluids. It has rich functions such as high temperature stability, wide temperature range, fault self diagnosis, and external communication.

"AEC-Q"is a collective term for a series of reliability testing standards for automotive electronic components developed by the Component Technology Committee of the Automotive Electronics Association.

The independently developed HAST high acceleration life test chamber for intercooled low-temperature is designed specifically for HTOL to meet the full requirements of vehicle grade reliability verification.