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What is the HALT standard? What is its function?
HALT is not a pass/fail test, but a series of tests conducted on the product to help improve its reliability.
2023-09-18 10:58:00
What are the main tests required before using the chip?
In the chip design phase, it is necessary to plan the testing content and methods based on the specifications and parameters of each chip.
2023-09-04 11:02:31
Application of Precision Temperature Cycling System in Reliability Testing of Automotive Chips
ThermoTST TS560 temperature test range -70 ℃ to+225 ℃, meeting the operating temperature range of various levels of the AEC-Q100 standard environment.
2023-08-21 16:40:56
Why do chips need to be tested before use and why should they be tested separately?
Chip testing generally involves two major steps, one called CP (Chip Probing) and the other called FT (Final Test). CP is testing for wafers, FT is testing for packaged chips
2023-08-14 10:50:42
Zonglen Thermal Inducing System Filter Element Replacement Guide
The ThermoTST Thermal Inducing System recommends performing maintenance and temperature calibration work every 12 months, replacing consumables such as filter cartridges, and the time interval also depends on the application environment and usage time of the equipment.
2023-08-08 10:46:12
What are the common interface interfaces for semiconductor testing?
To establish a stable signal connection relationship between the testing machine and the probe station, it is necessary to temporarily install the tested device on the semiconductor testing device, and execute the test by inputting and outputting test signals between the signal components set on the semiconductor testing device and the tested device
2023-08-01 14:08:16
What are the important related terms in the semiconductor testing industry?
The Semiconductor industry has become an indispensable part of all walks of life. Some common terms and their meanings can better understand the working principles of semiconductor chips
2023-07-24 10:28:06
What is WAT? What are the challenges faced?
WAT, also known as WAT process control monitoring, is a process that tests the electrical parameters of a specific test structure on a wafer, detects the process condition of each wafer product, evaluates the quality and stability of the semiconductor manufacturing process, and determines whether the wafer product meets the electrical specifications of the process technology platform.
2023-07-17 09:24:31
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