In semiconductor testing, the test head of the testing machine needs to be connected with the handler or wafer probe to generate signal connections. Between the devices to be tested, the semiconductor testing device and the interface board that can be installed on such a device are tested by inputting and outputting testing signals.

During the ATE device testing process, it is crucial to ensure a stable mechanical interface connection between the test head and the wafer probe. Customers often face frequent testing and docking tasks, high measurement accuracy requirements, different combinations of testing machines and probe stations, displacement, and a series of challenges So they need to establish a stable signal connection relationship between the testing machine and the probe station, and then they need to temporarily install the tested device on the semiconductor testing device, and execute the test by inputting and outputting test signals between the signal components set on the semiconductor testing device and the tested device.

The following is a common interface docking diagram:

Tester Prober

Tester – Handler

Tester - Prober