The CP chip test that must be conducted before slicing, on the one hand, verifies whether the various parameters and functions of the IC meet the design requirements, and on the other hand, marks the IC with failed parameters or functions from it

With the rapid development of the IC industry, the accuracy and stability of testing are two major challenges, especially in mass production ATE testing.

The main purpose of IC testing is to distinguish qualified chips from unqualified chips, ensuring the quality and reliability of the product.

In the AECQ100 vehicle certification process, many experiments require room temperature or high/low temperature testing before and after.

The accelerated test model is derived from testing the key factors of a product under normal stress levels and one or more accelerated stress levels.

HAST testing is widely used in the research and production process of various chip products, including microprocessors, storage chips, sensor chips, etc.

Accelerated testing refers to evaluating the reliability or lifespan indicators of a product under normal conditions by strengthening test conditions to accelerate the failure of the tested product, while ensuring that the failure mechanism of the product is not changed.

HAST accelerated aging technology is a commonly used testing method in the chip industry, used to simulate extreme environments and high temperature and humidity working environments that chips may encounter in actual use, in order to test the reliability and lifespan of chips.