Electronic component testing and screening services are also known as secondary screening of electronic components. The secondary screening of electronic components refers to the screening of electronic components by the user or a third party entrusted by the user based on the screening of component manufacturers. Secondary screening is a series of targeted tests conducted on the basis of various failure modes of electronic components to effectively eliminate early failures. Due to the current situation in the design, manufacturing, and processing of electronic components in China, as well as many uncontrollable factors in the procurement of imported components, secondary screening of electronic components has become an indispensable part in stimulating potential design and production defects in electronic components, effectively eliminating early failure products, and improving the reliability of the entire system.
Electronic component testing runs through product design, component selection, production stage component acceptance and selection, and product "secondary" screening at the product delivery stage. Try to eliminate defective components or components that may fail early due to potential adverse factors such as raw materials, equipment, processes, and human factors from a batch of components, and select qualified components with certain characteristics or determine whether the batch of products is acceptable to improve product reliability. Especially for imported components, ensure product quality is controllable through "secondary screening", Improve the overall reliability of equipment.
General requirements for testing and screening of electronic components: 1. Non destructive testing without changing the inherent reliability of components; 2. 100% screening of batch products; 3. Eliminate early failures and improve the reliability of components; The screening level is determined by the expected operating conditions and service life of the components.
Electronic component testing and screening involves a large variety of instruments and equipment. The following is a list of relevant test items and testing instruments and equipment for electronic component testing and screening:
Test items |
Testing instruments and equipment |
Electrical testing |
Impedance analyzer |
megger |
|
Withstand voltage tester |
|
Semiconductor parameter testing system |
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High precision plotter |
|
network analyzer |
|
Signal generator |
|
Spectrum analyzer |
|
Digital Integrated Circuit Test System |
|
Analog Integrated Circuit Test System |
|
Relay test system |
|
LCR, ohmmeter, etc |
|
Power module test system |
|
Environment and stress screening |
Temperature Forcing Systems: Cold and Hot Cycle Tests |
Vibration table: vibration test |
|
Constant acceleration test bench: constant acceleration test |
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Programmable power supply: voltage and power aging test |
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Electronic load: current, power aging |
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Particle collision noise tester |
|
Life/aging/aging test |
High temperature dynamic aging system for monolithic integrated circuits |
High temperature dynamic aging system for hybrid integrated circuits |
|
High temperature aging detection system for power module |
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High Temperature Aging Test System for Crystal Oscillators |
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Integrated aging detection system for discrete devices |
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Discrete Device Intermittent Life Test System |
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High temperature aging detection system for capacitors |
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High power transistor aging detection system |
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Low level lifetime screening system for relays |
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Relay Medium Level Life Screening System |
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High level lifetime screening system for relays |
|
Visual inspection |
light microscope |
metallurgical microscope |
|
Sealing test |
Helium mass spectrometer leak detector |
Fluorocarbon coarse leak detector |
|
X-ray radiography |
X-RAY Transmission system |
Scanning acoustic microscopy |
Acoustic scanning detection equipment |
Ultrasonic scanning microscope |
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