Reliability Evaluation of TFT Thin Film Transistors

2025-01-17 13:07:07

The reliability evaluation of TFT (Thin Film Transistor) is a comprehensive evaluation process, which is an important link to ensure the quality and stable performance of electronic products such as TFT LCD screens. There are numerous reliability evaluation projects for TFT, and the evaluation results will directly affect the quality and performance evaluation of TFT LCD screens. Through evaluation, TFT LCD screens with stable performance and reliable quality can be selected to provide high-quality display solutions for electronic products.

TFT type	Test project	Value Explanation
LTPS PMOS TFT DTFT/STFT	NBTS	•T=70℃，Vg=-30V，Vd=0V，Vs=0V •Extract the IDVG curve at regular intervals, typically at time points of 0, 10, 100, 1000, 1800, 3600, and 7200s •Calculate Δ Vth@7200s-0s
	PBTS	•T=70℃，Vg=30V，Vd=0V，Vs=0V •Extract the IDVG curve at regular intervals, typically at time points of 0, 10, 100, 1000, 1800, 3600, and 7200s •Calculate Δ Vth@7200s-0s
	HCI	•T=25℃，Vg=-15V，Vd=-30V，Vs=0V •Extract the IDVG curve at regular intervals, typically at time points of 0, 10, 100, 1000, 1800, 3600, and 7200s •Calculate Δ Vth@7200s-0s
	HYS	•T=25℃，Vd=-5.1V，Vs=0V •Vg scan from 15 to -15V, then from -15 to 15V •Calculate the Δ Vth of two IDVG curves
	CBTS	•T=70 ℃, Vg=L255 grayscale voltage, Vd=L255 grayscale voltage •Extract the IDVG curve at regular intervals, typically at time points of 0, 10, 100, 1000, 1800, and 3600s •Calculate Δ Vth@3600s-0s
	light	•Expose the sample to a certain intensity of light, test the IDVG curve before and after illumination, and calculate Δ Vth and Δ SS
	heating	•Heat the sample (25 → 40 → 60 → 80 ℃), test the IDVG curve at each temperature, and calculate Δ Vth and Δ SS