The high and low temperature impact airflow instrument TS-760 thermal testing machine is equipped with Keysight instrument machine, providing solutions for temperature testing of IGBT, RF Device, MOSFET, Hi Power LED and other power devices from - 50 ℃ to 250 ℃ High and low temperature impact airflow instrument TS-760 GPIB communication (IEE488) is perfectly compatible with Keysight instrument software and easy to operate

Power device temperature test case I:

The high and low temperature impact airflow meter TS-760 cooperates with Chengdu Intercooling Low Temperature Technology Thermo Chuck hot and cold table products, and Keysight B1505A or B1506A to complete the temperature test from room temperature to 250 ℃

Universal software, easy to operate, just place the device to be tested on the Thermo Chuck cold and hot table

Power device temperature test case II:

High and low temperature impact airflow instrument HTS-300 high temperature impact testing machine is equipped with B150XA system to provide a temperature testing environment of room temperature~250 ℃ During the test, just place the power device to be tested in the test cover of the high temperature tester If the test chamber is not connected, the test device may be damaged by hot air or condensed water The thermal shield connected to the test equipment and the high and low temperature impact airflow meter solves this problem and can be used accurately Reliable and repeatable temperature characteristic test

At the same time, the high and low temperature impact airflow tester TS-780 is also equipped with the Keysight B150XA system to evaluate the characteristics of power devices within the temperature range of - 50 ° C to+250 ° C. It is a common test method among semiconductor device manufacturers. As long as the heat flow hood is placed on the test chamber, it can be quickly tested in an open environment