EM-HAST

As electronic devices become smaller and denser, electro-chemical migration evaluation and insulation evaluation have become more important. Electrochemical migration (ECM) can result in the growth of a metal deposit from cathode to anode. It could happen on both the surface and inside of PCBs. In electronics, such growth can lead to a short-circuit by bridging the electrodes, potentially leading to intermittent or complete failure of electronic devices.

The EM-HAST Electrochemical Migration system enables accurate and efficient evaluation of insulation resistance and life evaluation when electro-chemical migration occurs. It has various applications, from low voltage testing to high voltage testing.

Application

PCB, solder, flux, coating materials, etc., GBA, DSP and other micro-pitch graphic IC packaging, capacitors, connectors and other electronic devices and material insulation material moisture absorption characteristics test evaluation.

Features

Wide application voltage range -100 to +500V/-100 to +1000V.

Real-time current monitoring function

Test the pre-detection function

Language English/Chinese

Multiple threshold determination function

Status Ailment Alert

Support data analysis

Highly accelerated electrochemical migration assessment with HAST

Specifications

For more detailed parameters, please contact us!