B-HAST bias Burn-in test system is suitable for IC packages, semiconductors,microelectronic chips, magnetic materials and other electronic parts for high  pressure, high temperature, unsaturated/saturated wet and heat, and other accelerated life reliability test, used in the design stage of the product, for quickly exposing the defects and weak links of the product, testing the tightness and aging performance of its products.

B-HAST bias Burn-in test system is to place the measured component in a certain ambient temperature and humidity (the ambient temperature and humidity are set according to the test standard of the measured component), and apply a certain bias voltage to the measured component. At the same time, the control system detects the leakage current and voltage of each material in real time, and according to the pre-set, when the real-time leakage current of the measured material exceeds the set, the voltage of the measured material will be automatically cut off, which can protect the measured component from further damage.

Features

Individual Vgs control for each device

Real-time monitoring of Id and Ig parameters of each device under test

The power-on and power-off sequence can be controlled

The whole process test data is saved in the hard disk and can be output in Excel

Test report and draw the whole process leakage current Ir curve

Leakage current overlimit protection, automatically cut off the  measurement circuit

Application

Diode, transistor, MOSFET, IGBT, SBD, GaN Fet, SCR, and various package forms of RF MOSFETs, RF power devices under temperature and humidity reverse bias test.

Specifications

For more detailed parameters, please contact us!